The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1998
Filed:
Sep. 11, 1996
Applicant:
Inventors:
David R Fladd, Canton, NY (US);
Stephen J Rieks, Moravia, NY (US);
Assignee:
Corning Incorporated, Corning, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01L / ; G01B / ; G06G / ;
U.S. Cl.
CPC ...
356 355 ; 356359 ; 364572 ; 364575 ;
Abstract
A process for detecting inhomogeneities, specifically, striae in a sample of fused silica glass is provided which includes the steps of: preparing a digitized phase plot for the sample using an interferometer which produces a beam of light which passes through the sample; applying a high pass filter to the phase plot to remove the effects of the sample's bulk properties; applying a statistical filter to the high pass filtered data to remove outlying data points; and column averaging the statistically filtered data. If present, striae can be readily detected in the column averaged, statistically filtered data.