The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1998
Filed:
Feb. 22, 1995
Jeffrey A Hawthorne, San Francisco, CA (US);
Daniel H Scott, San Jose, CA (US);
Robert E Cummins, El Granada, CA (US);
Peter J Fiekowsky, Los Altos, CA (US);
Photon Dynamics, Inc., San Jose, CA (US);
Abstract
An improved testing system and method for testing a flat-panel display is disclosed herein. A display is positioned under a high resolution camera for detection of, for example, brightness uniformity across the display. Errors in the detected image due to aliasing are avoided in the present invention by incrementally shifting the displayed image relative to the camera and detecting the displayed image at various shifted positions. A resulting accurate display can then be reconstructed by identifying those detector pixels generating a maximum signal. A single image may then be reconstructed using only those detected maximum pixel signals. The reconstructed image will be free of aliasing. The reconstructed image may then be analyzed electronically, and any anomalies in the pixels forming the display panel can then be accurately detected. Anomalies due to uneven brightness across the display can be corrected by programming a memory chip for the particular display panel to permanently compensate the display driver signals for each display pixel to eliminate such anomalies in the display. Other tests for viewing angles and chromaticity may also be performed.