The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 09, 1998

Filed:

Jun. 09, 1997
Applicant:
Inventors:

Kazuo Yoshinaga, Machida, JP;

Shinobu Arimoto, Yokohama, JP;

Toshio Hayashi, Kawasaki, JP;

Takehiko Nakai, Tokyo, JP;

Tsutomu Utagawa, Yokohama, JP;

Tetsuya Nagase, Kawasaki, JP;

Nobuatsu Sasanuma, Yokohama, JP;

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
2504591 ; 250271 ; 2503417 ; 2504581 ;
Abstract

A method and apparatus for processing a medium on which an identification mark is formed using a plurality of recording materials having fluorescent characteristics in wavelength regions almost overlapping with each other and having maximum absorbing characteristics at different wavelengths. The method and apparatus include the features of detecting, on the medium, the identification mark which is comprised of the plurality of recording materials and controlling an operation of a processing apparatus in accordance with a result of the detecting of the identification mark.


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