The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 09, 1998
Filed:
Mar. 19, 1997
John Carl Schotland, Wynnewood, PA (US);
Masaru Ishii, Phila, PA (US);
Other;
Abstract
A method for the direct reconstruction of an object from measurements of the quantum efficiency determined from both a diffusing wave and a reradiated diffusing wave effected by irradiating the object with a source of radiation. The quantum efficiency is related to the number density of the fluorescent source distribution defining the image to be reconstructed by an integral operator. The image of the object is directly reconstructed by executing a prescribed mathematical algorithm, as determined with reference to the integral operator, on the quantum efficiency.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile