The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1998

Filed:

Jun. 07, 1995
Applicant:
Inventors:

Alexei Stoianov, Toronto, CA;

Colin Soutar, Scarborough, CA;

George J Tomko, East York, CA;

Assignee:

Mytec Technologies, Inc., Don Mills, CA;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ; G06K / ;
U.S. Cl.
CPC ...
382127 ;
Abstract

A hybrid optical-digital technique is provided for automatic fingerprint verification. A coherent optical beam modulated with the characteristics of a fingerprint image passes through the lens performing an optical Fourier transform. The intensity array that represents the Fourier power spectrum is recorded and processed. In enrolment, several arrays related to the same finger are captured and processed. A template which is unique for each fingerprint is generated and stored. Using the set of arrays captured in enrolment and a set of templates from a standard database, the processor calculates dependences of false rejection rate and false acceptance rate upon a metric of comparison. The metric is obtained by calculating a relative distance between two arrays in Hilbert space. An individual threshold of verification for a person to be enroled is set and stored together with the template. In verification, the metric of comparison between the processed array derived from a fingerprint to be verified and the pre-stored template is determined and compared with the pre-stored individual threshold.


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