The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1998

Filed:

May. 08, 1997
Applicant:
Inventors:

Glenn F Urbish, Coral Springs, FL (US);

William Boone Mullen, III, Boca Raton, FL (US);

Scott G Potter, Coconut Creek, FL (US);

Assignee:

Motorola, Inc., Schaumburg, IL (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
364552 ; 36455101 ; 36446814 ; 36446817 ;
Abstract

An automated method of predicting the number of defects that will occur during the manufacturing of a new electronic assembly design on a specific assembly line. Defective components are counted (214) as they are manufactured on an assembly line (210). The counted defects are stored in a historical database (220) and the defect rate is calculated. A bill of material for the new electronic design (230) is enumerated and information associated with each component is extracted from a library database (240) into a quality forecasting engine (250). The quality forecasting engine imports the enumerated bill of material and imports the stored defect rate from the historical database to perform a calculation of a predicted number of defects (260) for said new electronic assembly using the extracted library information.


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