The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1998
Filed:
Oct. 10, 1995
Kenneth C Gross, Bolingbrook, IL (US);
Ralph M Singer, Naperville, IL (US);
The University of Chicago, Chicago, IL (US);
Abstract
A method and system for monitoring both an industrial process and a sensor. The method and system include determining a minimum number of sensor pairs needed to test the industrial process as well as the sensor for evaluating the state of operation of both. The technique further includes generating a first and second signal characteristic of an industrial process variable. After obtaining two signals associated with one physical variable, a difference function is obtained by determining the arithmetic difference between the pair of signals over time. A frequency domain transformation is made of the difference function to obtain Fourier modes describing a composite function. A residual function is obtained by subtracting the composite function from the difference function and the residual function (free of nonwhite noise) is analyzed by a statistical probability ratio test.