The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1998
Filed:
Mar. 22, 1996
Norbert Basler, Hoisdorf, DE;
Jorg Fiedler, Ahrensburg, DE;
Bryan Hayes, Hamburg, DE;
Frank Hermann, Bad Oldesloe, DE;
Basler GmbH, Ahrensburg, DE;
Abstract
A process and device for the optical testing of a surface in which the surface can be illuminated substantially from above by at least one upper light and from the side by at least one lower light, at a sharp angle with respect to the surface. The light reflected and/or scattered by the surface is recorded in a test period by at least one light-sensitive receiver and at least one actual image which is compared with at least one desired image is produced. To permit an improved test provision is made for the surface to be recorded by the light-sensitive receiver at least twice during the test period. During the recording periods in question the surface is illuminated by an at least intermittent illumination from above and/or from the side in a different manner in order to obtain at least two actual images with different illumination of the surface.