The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1998

Filed:

Dec. 17, 1996
Applicant:
Inventor:

Tohru Koyama, Tokyo, JP;

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ; 356 71 ; 356429 ; 356388 ; 356390 ;
Abstract

A method of analyzing a failure of semiconductor device by using an emission microscope for easy analysis of current leakage is disclosed. Light emission information is stored in X/Y memory spaces (16), with a Z direction indicating an emitted light intensity. A light emission presence bit (17) in the light emission information means a bit for which light emission is judged as being present, and the number of light emission presence bits is determined on the basis of the emitted light intensity. An image memory (11) has a three-dimensional memory space including an X/Y space indicative of plane positions of light emitting portions and a Z space indicative of the emitted light intensity. The position and intensity of light emission are detected by searching the light emission information stored in the image memory (11) to analyze the failure.


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