The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1998
Filed:
Jan. 05, 1996
Applicant:
Inventor:
Ernest A Graff, Ontario, NY (US);
Assignee:
Eastman Kodak Company, Rochester, NY (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
356237 ; 356237 ; 356375 ; 242 673 ; 242 56 ; 242 57 ; 242 571 ;
Abstract
Method and apparatus for measuring the quality of the planar end surface of a wound roll comprising: optically projecting a line of light onto the planar end surface of the wound roll to generate and reflect an image of the line of light; focusing the reflected image onto an image sensor to obtain a data output; and feeding the data to a processor that measures deviations in the reflected image of the line of light that are caused by variations in the planar end surface of the wound roll.