The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
Jun. 02, 1998

Filed:

Jun. 06, 1995
Applicant:
Inventor:

John W Sussmeier, Wappingers Falls, NY (US);

Assignee:
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H04N / ;
U.S. Cl.
CPC ...
348187 ; 348188 ; 348126 ; 382145 ;
Abstract

A system and method allows a user to evaluate the critical optical parameters associated with an imaging device including a CCD array. The system includes a series of optical test targets. Digital images of the optical test targets are captured by the imaging device under test. The stored digital image data is automatically analyzed by a computer program which evaluates the dynamic range, contrast resolution and distortion of the imaging device. The results are compared to predetermined criteria and printed for evaluation by a user. The system provides a means for comparing and qualifying various camera systems to be used for package tracking.


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