The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1998
Filed:
Apr. 18, 1996
Hammam Elabd, Sunnyvale, CA (US);
Loral Fairchild Corp., Syosset, NY (US);
Abstract
Charge coupled device X-ray sensor and camera capable of imaging with high modulation transfer function for high resolution. The high resolution is achieved by a method of simultaneously measuring the modulation transfer functions of x-ray and visible images while imaging the target or the scene. Then, by using the point spread function and measured MTFs at various spatial frequencies to calculating spatial frequency dependent correction table or correction parameters. This correction is applied to the raw image of the target inside a workstation using a software embodiment of the correction algorithm. The high precision, multi-spatial frequency patterns that are used in x-ray image correction are provided on the sensor, the scintillator screen and the fiber optic face plate of a sensor device to enable the user of the workstation to measure the modulation transfer functions (contrast transfer function) in the horizontal, vertical and in oblique orientations at several spatial frequencies.