The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Jun. 02, 1998
Filed:
May. 08, 1996
Applicant:
Inventors:
Toshimitsu Musha, Machida-shi, Tokyo, JP;
Yuichi Yanai, Okazaki, JP;
Shoji Takagi, Okazaki, JP;
Shu Ono, Okazaki, JP;
Assignees:
Nisshinbo Industries, Inc., Tokyo, JP;
Other;
Primary Examiner:
Int. Cl.
CPC ...
D03D / ;
U.S. Cl.
CPC ...
139192 ; 139 / ; 139417 ; 1391161 ; 36447011 ; 364140 ;
Abstract
A weaving method that imparts a 1/f fluctuation to the weave pattern. Adjacent and different numbered groups of different yarns, for example black yarn and white yarns, are alternately arranged in contiguous reed dents. The sequential number which is associated with each group manifests a series of numbers which effect the 1/f fluctuation. Following separation of the warp yarns into two sets by raising and lowering of healds to form a shed and passage of weft yarns therethrough, a woven fabric with a stripped 1/f fluctuation in the warp direction is created.