The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Aug. 28, 1996
Applicant:
Inventors:
Christos Faloutsos, Silver Spring, MD (US);
Yossi Matias, Potomac, MD (US);
Abraham Silberschatz, Summit, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
707-6 ;
Abstract
The invention concerns a method for estimating characteristic information of data items in a data set, such as a database, based on parameters of a multifractal distribution. The invention facilitates efficient estimation of such characteristic information of data contained in a data set more accurately than known estimation methods and without requiring an exhaustive analysis of the data. The invention also concerns an efficient technique for generating the parameters for the multifractal distribution.