The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Aug. 28, 1995
Martin Howard Meyers, Montclair, NJ (US);
Ahmed A Tarraf, Bayonne, NJ (US);
Carl Francis Weaver, Hanover Township, Morris County, NJ (US);
Lucent Technologies Inc., Murray Hill, NJ (US);
Abstract
A fidelity measuring apparatus (103). The fidelity measuring apparatus (103) measures the fidelity of a system (101). A preprocessor (109) receives an input signal. The preprocessor (109) also receives an output signal from the system (101). The preprocessor (109) extracts a feature set from the output signal. An artificial intelligence tool (111), trained in the relationship between fidelity and the feature set, generates an output that is a measure of the fidelity of the system (101). A fidelity measuring apparatus (103b) includes a preprocessor (138) and two or more artificial intelligence tools (111-N). The artificial intelligence tools (111-N) are independently trained by input signals from different sources. An averaging circuit (140) averages the output of each artificial intelligence tool (111-N). The fidelity measuring apparatus (103b) operates to produce accurate fidelity measurements independent of the input signal, the source of the input signal and the technology of the system.