The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Oct. 28, 1992
Yasuo Hongo, Tokyo, JP;
Atsushi Yoshida, Tokyo, JP;
Fuji Electric Co., Ltd., Kanagawa, JP;
Fujifacom Corporation, Tokyo, JP;
Abstract
A method for nonlinear normalization of an image, which performs pre-processing for computing the correlation between an unknown pattern and a reference pattern. A local spatial density function .rho.(X.sub.i, Y.sub.j) (i=1-I, j=1-J) is calculated from a two-dimensional pattern f(X.sub.i, Y.sub.j) which is obtained by sampling the unknown pattern at a sampling interval .gamma.. The spatial density function .rho.(X.sub.i, Y.sub.j) is obtained as the product of reciprocals of line pitches in both the X and Y directions. An x-direction cumulative function hx(X.sub.i) and a y-direction cumulative function hy(Y.sub.j) are computed by successively adding the space density function .rho.(X.sub.i, Y.sub.j). New sampling points (X.sub.i, Y.sub.j) are computed in such a fashion that new sampling intervals (.delta.i, .epsilon.j), defined as intervals between two adjacent points of the new sampling points (X.sub.i, Y.sub.j), satisfy the condition that a product between the cumulative function hx(X.sub.i) and .delta.i takes a first fixed value, and a product between the cumulative function hy(Y.sub.j) and .epsilon.j takes a second fixed value. The normalized sampled values at the new sampling points (X.sub.i, Y.sub.j) are obtained by resampling the unknown pattern or by performing a computation on the two dimensional pattern f(X.sub.i, Y.sub.j).