The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Sep. 20, 1994
Chih-Chau L Kuan, Redmond, WA (US);
Shih-Jong J Lee, Bellevue, WA (US);
Mikel D Rosenlof, Boulder, CO (US);
Robert C Schmidt, Redmond, WA (US);
NeoPath, Inc., Redmond, WA (US);
Abstract
Field of views of a slide are examined to assess the likelihood of existence of detectable single cells, groups, and thick groups of cells to locate objects of interest by an automated microscope. The FOV features consists of features selected from the distribution profiles of size, shape, layout arrangement, texture and density of all objects within a FOV which are compared against pre-determined criteria. Each field of view is assigned a likelihood value based on FOV features. Areas that are blank, or contain air bubbles, or are too dense for analysis are identified and excluded for further analysis. Each FOV is ranked according to its likelihood of containing SIL (Squamous Intraepithelial Lesion) cells or cell groups of interest. These results, such as SIL, single cell ranking, group ranking are used to arrange the further examination of FOVs in a priority order.