The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Mar. 27, 1996
Toyofumi Arai, Ama-gun, JP;
Akira Narukawa, Yokkaichi, JP;
NGK Insulators, Ltd., , JP;
Abstract
An automatic analysis system comprising analytical equipment and a host computer connected to the analytical equipment. The host computer assigns identification numbers to pieces of analysis information, respectively, further assigns identification numbers to the pieces of analysis information respectively, to relate the pieces of analysis information to each other, groups a predetermined number of the pieces of analysis information to form pieces of group information, assigns identification numbers to the pieces of group information, respectively, further groups a predetermined number of the pieces of group information to form pieces of group information, and then assigns identification numbers to the pieces of group information, respectively. A storage device is provided for storing the pieces of analysis information and group information to which the identification numbers are given by the host computer. The host computer further retrieves the pieces of analysis information and group information stored in the storage means, reads same in a mutually related manner, processes and edits same. An arrangement form or the final results edited by the control means are output by output means. According to this automatic analysis system, a chemical analysis test can be promptly and efficiently processed and artificial errors scarcely occur, so that the test results having an extremely high reliability can be reported.