The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Jun. 17, 1996
Alan J Rider, Reston, VA (US);
Lester R Querry, Reston, VA (US);
Stephen Landsman, Baltimore, MD (US);
Other;
Abstract
An electronic system for incorporation in a racquet that monitors a player's ability to hit balls within a specific region on the string bed. A plurality of sensors are positioned around the periphery of the racquet string bed for detecting the relative time-of-arrival of transverse waves produced by impacts of balls on the string bed. A circuit incorporated within the racquet receive the signals from the sensors and provide a plurality of signals from which the position of impact on the string bed may be calculated. The system incorporates a low power microprocessor that is programmed to compute the ball impact location from the signals produced by the sensors. A display device on the racquet displays information derived from the calculated impact location to permit players to assess their performance as related to hitting a predetermined region. A sound generator is incorporated that emits audible signals having an amplitude, frequency and duty cycle that indicate relative positions of impact on the string bed. The system provides for statistical reporting of impacts as either percentages within a zone or a total tally of impacts. A user interface is provided permitting selection of various modes of operation. The microprocessor architecture and programming is optimized for lower power consumption while providing adequate resolution of impact locations.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile