The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 26, 1998
Filed:
Apr. 30, 1997
Hitachi, Ltd., Tokyo, JP;
Abstract
The first glass substrate having the first pressure admitting entrance for leading the pressure of fluid to be measured, is arranged at a side of a diaphragm of a pressure sensor, for measuring differential pressure. The second glass substrate is arranged at the side opposite to the first glass substrate, a spacer being sandwiched therebetween. The second pressure admitting entrance is formed at the second glass substrate, at the position opposite to the first presser admitting entrance of the first glass substrate. The first conductive film and the second conductive film are formed on two surfaces facing to each other, of the first and second glass substrates, respectively. By measuring the specific conductance and the dielectric constant of the object fluid between the two conductive films, these physical constants indicating the quality of the fluid, the quality of the fluid can be also detected. Thus, it becomes possible to realize and provide an integrated sensor capable of measuring the differential pressure (flow rate) and the quality of fluid by using one transmitter.