The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1998
Filed:
Jul. 23, 1996
William M McKeeman, Hollis, NH (US);
August C Reinig, Hudson, NH (US);
Andrew Payne, Lincoln, MA (US);
Digital Equipment Corporation, Maynard, MA (US);
Abstract
Techniques used in testing software are described. A test generator produces a source program used to test two or more compilers using a differential testing technique. The test generator includes a grammar with added semantic constraints to minimize the generation of non-conforming source programs. The source program is a conforming source program conforming to constraints included in a programming language standard. By using properties of a conforming source code, a differential testing technique is described in which a test failure indicates that one or more of the compilers is not processing the source program correctly in accordance with the programming language standard. If a test failure is detected, the source program causing the test failure is reduced using various reduction and simplification techniques.