The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1998

Filed:

Dec. 26, 1995
Applicant:
Inventors:

Matthew S Holcomb, Colorado Springs, CO (US);

Michael L Beyers, Colorado Springs, CO (US);

Assignee:

Hewlett-Packard Co., Palo Alto, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01R / ;
U.S. Cl.
CPC ...
364487 ; 364485 ; 3241 / ;
Abstract

In a test instrument, display locking is reduced by the addition of a non-constant time delay to each acquisition cycle. The time delay may be randomly chosen or follow a predetermined algorithm. Decreased system throughput caused by the addition of a non-constant time delay may be minimized by alternately storing acquired data in two acquisition memories. Display locking may also be reduced by rejecting selected triggers. The data acquired from these selected triggers is not processed for display. The triggers whose data is not processed for display may be randomly chosen or they may be chosen by a predetermined algorithm. Rejecting triggers and the addition of a non-constant time delay may be used in combination or individually to reduce display locking.


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