The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1998
Filed:
Aug. 08, 1996
Hiroshi Yamamoto, Kyoto, JP;
Harumi Uenoyama, Kyoto, JP;
Xiaoming Dou, Kyoto, JP;
Yung Xiang Wang, Kyoto, JP;
Kentaro Shimada, Kyoto, JP;
Kyoto Dai-Ichi Kagaku Co., Ltd., Kyoto, JP;
Abstract
As to respective expiration components to be measured, wavelengths having excellent correlations between component concentrations and Raman spectral intensity values are previously selected as measuring wavelengths which are specific to the components, an expiration specimen is irradiated with Raman excitation light, Raman spectra at the measuring wavelength which is specific to nitrogen and those at the measuring wavelengths previously selected for the components to be measured respectively are measured, Raman spectral intensity ratios of the components to the Raman spectral intensity of nitrogen are obtained, and the respective expiration components are quantitatively analyzed through a calibration curve which is previously prepared as to the Raman spectral intensity ratios of the respective components to nitrogen and concentrations. It is possible to provide a measuring method utilizing Raman spectroscopy, which can directly determine intra- expiratory components in a short time with no requirement for expendable items.