The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1998
Filed:
Jan. 08, 1997
Yukari Onodera, Asaka, JP;
Etsuji Yamamoto, Akishima, JP;
Hiroyuki Itagaki, Kokubunji, JP;
Yo Taniguchi, Hachioji, JP;
Hitachi Medical Corporation, Tokyo, JP;
Abstract
An inspection method by means of an inspection apparatus using nuclear magnetic resonance and having magnetic field generating apparatus for generating a static magnetic field, gradient magnetic fields and an RF magnetic field; magnetic field generating apparatus by means of additional shim coils, which vary homogeneity of the static magnetic field by varying current flowing therethrough; signal detecting apparatus for detecting nuclear magnetic resonance signals from an object to be inspected; an apparatus for processing signals detected by the signal detecting apparatus; and control apparatus for controlling currents flowing through the shim coils, which method using nuclear magnetic resonance comprises a step of storing shim currents corresponding to each of a plurality of slices, capable of improving homogeneity of the static magnetic field for each of the plurality of slices, and a step of switching over the shim currents to those corresponding to a relevant slice to be measured prior to measurements of nuclear magnetic resonance signals from the slice. This inspection method can be applied also to a case where measurements of other slices are effected in intervals of measurements of the relevant slice.