The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1998

Filed:

Jul. 26, 1995
Applicant:
Inventors:

Martin G Buehler, La Canada, CA (US);

Brent R Blaes, San Dimas, CA (US);

George A Soli, Lancaster, CA (US);

Assignee:
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01T / ;
U.S. Cl.
CPC ...
25037006 ; 25037007 ; 250394 ;
Abstract

An integrated charge monitor for measuring a level of cumulative radiation exposure includes semiconductor devices having characteristics that change with a cumulative level of radiation to which the devices are exposed, different amounts of radiation shielding associated with each of the devices, and circuitry operable to separately address each of the devices to measure a change in the characteristic of the selected device due to radiation exposure. The monitor may be implemented on a single integrated circuit chip. The monitor may also be employed in performing a spectrometric analysis of radiation based on the affect of the radiation on characteristics of multiple, differently-shielded semiconductor devices.


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