The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1998
Filed:
Oct. 03, 1996
Willem MJ. Coene, Eindhoven, NL;
Augustus JE.M. Janssen, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
A method of non-recursive reconstruction of images in a High Resolution Electron Microscope (HRTEM). In an HRTEM a series of, for example, 100 images of an object is formed with each time a different setting of the astigmatism of the imaging lens or lenses. By subjecting these images to a Fourier transformation and multiplying the transformed images by a known filter function, a reconstruction of the object electron wave function is obtained by summing of the images thus filtered and transformed; said object electron wave function no longer contains the linear information which is undesirable for the reconstruction and the non-linear information which is not negligibly small for large thicknesses of the object is no longer present either.