The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1998

Filed:

Jul. 12, 1996
Applicant:
Inventors:

Darrell L Gourley, San Francisco, CA (US);

Eugene M Wong, Campbell, CA (US);

James L Bertsch, Palo Alto, CA (US);

Robert G Nordman, Palo Alto, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
B01D / ; H01J / ;
U.S. Cl.
CPC ...
250288 ; 250281 ;
Abstract

An atmospheric pressure ionization source is provided which includes an ionization chamber that is formed from the combination of an angled chamber body and a correspondingly angled chamber seal. The ionization chamber is used for electrospray or atmospheric pressure chemical ionization of a liquid sample to provide ionized molecules. The ionized molecules can be passed to an associated analytical device that is capable of detecting and measuring the mass-to-charge ratio and/or the mass and charge of the molecules. A mass spectrometer which includes the present atmospheric pressure ionization source is also provided, as well as a liquid chromatography/mass spectrometry (LC/MS) analysis system which includes an LC/MS interface comprising the present atmospheric pressure ionization source.


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