The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 19, 1998
Filed:
Nov. 17, 1995
Melvin Park, Nashua, NH (US);
Victor George Fursey, Beverly, MA (US);
John Wronka, Haverhill, MA (US);
Bruker Analytical Systems, Inc., Billerica, MA (US);
Abstract
A method and apparatus for analyzing ions by determining times of flight including using a collision cell to activate ions toward fragmentation and a deflector to direct ions away from their otherwise intended or parallel course. Deflectors are used as gates, so that particular ions may be selected for deflection, while others are allowed to continue along their parallel or otherwise straight path, from the ion source, through a flight tube, and eventually, to a detector. According to the present invention, a postselector, in the form of two deflection plates is used as an ion deflector and is encountered by ions after the collision cell as they progress through the spectrometer.