The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1998

Filed:

Jun. 27, 1997
Applicant:
Inventors:

Dick J Chang, Los Angeles, CA (US);

William D Hanna, Rolling Hills Estates, CA (US);

Assignee:

The Aerospace Corporation, El Segundo, CA (US);

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
73842 ; 73845 ; 73827 ;
Abstract

A back-to-back, single lap-joint test fixture and method provides for uniform shear strength determination in a lap-joint area at an adhesive bond plane between a low-modulus rubber-like elastic material substrate and a stiff panel both defining a single lap-joint specimen, two of which are disposed back-to-back with the rubber substrates being constrained from lateral deformation by respective aluminum housings each having a load-transferring lip pushing upon a substrate also being pulled by load transferring dowel pins pulling upon the rubber substrate while with a restraining clamp that restrains transverse movement of the housing and rubber substrate all so as to produce only shear-type failures based on the near-incompressible nature of the rubber materials in the two back-to-back single lap-joint specimens.


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