The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 19, 1998

Filed:

Dec. 02, 1996
Applicant:
Inventors:

Kentaro Asakura, Tokyo, JP;

Yasuhisa Hirohata, Tokyo, JP;

Nobuyoshi Kataoka, Sakado, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G01N / ;
U.S. Cl.
CPC ...
83713 ; 83 769 ; 83412 ; 839155 ;
Abstract

A microtome particularly suitable for sectioning specimen to be observed on a transmission type electron microscope. Mounted on top of and located to one side of a machine base (2) are an X-Y axis stage and a tilting stage (4) which in turn supports thereon a cutter holder block (5) with a cutting knife (6). Located to the other side of the machine base (2) is a micro-feed mechanism (7) which supports thereon a specimen holder support arm (12) with specimen (14) and a Z-axis stage (11). The micro-feed mechanism (7) has first and second linear motor stages (8) and (9) to be displaced inversely in intersecting directions crossed each other with a predetermined intersection angle (28) across Y-axis. As the first and second linear motor stages (8) and (9) are displaced at the intersection angle (20) with each other, the specimen (14) is displaced over a small distance of nanometrically fine level in the direction of X-axis, thereby permitting to produce an ultra-thin specimen piece.


Find Patent Forward Citations

Loading…