The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 1998

Filed:

Sep. 19, 1995
Applicant:
Inventor:

Yutaka Arakawa, Tokyo, JP;

Assignee:

Kabushiki Kaisha Toshiba, Kawasaki, JP;

Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G11B / ;
U.S. Cl.
CPC ...
39518507 ;
Abstract

When the idling state of a magnetic disk apparatus is detected by a CPU, a timer is started to measure a time started from the start of the idling state. When a predetermined time has elapsed, an error detection circuit performs a defect inspection of a magnetic disk from an access address stored in an EEPROM. When the defect in the magnetic disk is detected, the CPU refers to a table in the ROM to check a defect level. Substitute processing is performed to an area having the defect on the basis of the defect level. A host system is notified of the defect level depending on the defect level.


Find Patent Forward Citations

Arakawa, Yutaka. (1998). Magnetic disk apparatus having inspection function of recording medium (U.S. Patent No. 5751947). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5751947

Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile

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