The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1998
Filed:
Jul. 12, 1996
Wilhelmus J Welters, Eindhoven, NL;
Jacob Wijdenes, Eindhoven, NL;
U.S. Philips Corporation, New York, NY (US);
Abstract
An X-ray examination apparatus (1) includes a filter (4) which is arranged between the X-ray source (2) and the X-ray detector (3). The X-ray filter includes a large number of filter elements (5); the X-ray absorptivity of the filter elements can be adjusted by controlling the quantity of X-ray absorbing liquid (6) than individual filter elements. The filter elements are formed by metal capillary tubes or the wall of the capillary tubes, or the wall of the capillary tubes is provided with a metal layer (7). On the metal layer there is provided a dielectric layer (8) and the dielectric layer is covered by a coating layer (9). The dielectric layer is, for example a glass, parylene or polystyrene layer. The coating layer is, for example a Teflon, silane or siloxane layer. The dielectric layer can be dispensed with when a Teflon coating layer is used.