The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1998
Filed:
Aug. 21, 1996
Tohru Wada, Niiza, JP;
Yasushi Hibi, Kokubunji, JP;
Olympus Optical Co., Ltd., Tokyo, JP;
Abstract
A color classification system and method for classifying, judging and/or identifying objects by color. An optical system utilizes light from an object to form an image on an imaging device. A plurality of optical band-pass filters each having a different pass band are provided between the object and the imaging device. The optical band-pass filters include a plurality of measurement filters for use in measuring a color of the object and a test filter for use in judging which one of the measurement filters should be applied to the object. A changeover section changes between the optical band-pass filters. A computing circuit performs at least one of a color classification and a color judgment based on a spectral characteristic of the imaged object through a statistical approach, and a control section causes the changeover section to select an effective one of the measurement filters based on a judgment by the computing circuit of a result sensed by the test filter. The plurality of optical band-pass filters are arranged in a plurality of filter sets each of which has at least one filter, and the changeover section includes a filter changeover mechanism for changing between the optical band-pass filters in one of the filter sets, and a filter-set changeover mechanism for changing between the plurality of filter sets.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile