The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1998
Filed:
May. 10, 1996
Eiichi Kimura, Neyagawa, JP;
Naoki Yanai, Neyagawa, JP;
Motonobu Shiomi, Neyagawa, JP;
Emi Ashibe, Kyoto, JP;
Yutaka Yamasaki, Kyoto, JP;
Harumi Uenoyama, Kyoto, JP;
Kurashiki Boseki Kabushiki Kaisha, Okayama-ken, JP;
Kyoto Daiichi Kagaku Co., Ltd., Kyoto, JP;
Abstract
In an optical measuring apparatus of the present invention, a spectroscopic optical system emits a measuring light beam that contains a measure light component of a measure wavelength domain where a measured object absorbs part of the light and a reference light component of a reference wavelength domain where the measured object almost completely absorbs the light, and separates the beam into beams, a photometric unit measures the light incident on an integrating sphere when a reference sample is inserted in the light path and stores the measurements in a memory and also measures the light incident on an integrating sphere when a measured object is inserted in the light path, and an arithmetic circuit calculates a light intensity ratio of the compensation light component for the measured object to the compensation light component stored in memory and then estimates background intensities during the measurement by multiplying the measurements stored in the memory by the intensity ratio.