The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1998
Filed:
Apr. 02, 1997
Applicant:
Inventors:
Takashi Masuda, Yamato, JP;
Kyoji Sekiguchi, Yokohama, JP;
Toshiaki Okumura, Yokohama, JP;
Hiroshi Aoki, Kawasaki, JP;
Osamu Yamamoto, Yokohama, JP;
Assignee:
Canon Kabushiki Kaisha, Tokyo, JP;
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
A61B / ;
U.S. Cl.
CPC ...
351221 ; 351208 ;
Abstract
This invention provides an ophthalmic measuring apparatus and an ophthalmic apparatus particularly for observation by retroillumination. The ophthalmic measuring apparatus is provided with an eye measuring system, an observing system enabling observation of the eye to be examined by the examiner, an anterior segment illuminating system and a control system. The ophthalmic apparatus is provided with an observing system enabling observation of the eye to be examined, an ocular fundus illuminating system, a time measuring means and a control system.