The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 12, 1998

Filed:

Feb. 03, 1997
Applicant:
Inventors:

James A Apffel, Palo Alto, CA (US);

Mark H Werlich, Santa Clara, CA (US);

James L Bertsch, Palo Alto, CA (US);

Paul C Goodley, Cupertino, CA (US);

Assignee:

Hewlett-Packard Company, Palo Alto, CA (US);

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250288 ;
Abstract

A method apparatus wherein a plurality of electric fields and of orthogonal spray configurations of vaporized analyte are so combined as to enhance the efficiency of analyte detection and mass analysis. The method and apparatus provides reduced noise and increased signal sensitivity in both API electrospray and APCI operating modes.


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