The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 12, 1998
Filed:
Feb. 25, 1997
Applicant:
Inventor:
William Drohan, Bedford, MA (US);
Assignee:
ADE Corproation, Westwood, MA (US);
Primary Examiner:
Int. Cl.
CPC ...
G01M / ;
U.S. Cl.
CPC ...
738659 ; 324 731 ; 36446815 ; 36446828 ; 364579 ; 364552 ;
Abstract
A testing system with real time/off line functionality allocation is disclosed. The real time functions are limited to movement of objects to be tested through the testing stations, operation of sensors to gather raw data, and storage of the raw data. The off line functions include removing artifacts in the raw data, analyzing the raw data according to various rules, and controlling the sorting of the tested objects according to the analysis. By limiting the real time processing to a few essential elements necessary for operation of the testing line, the testing line can proceed even if the off line functions are not operating.