The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Sep. 12, 1996
Applicant:
Inventors:
Chongjun (June) Jiang, Dallas, TX (US);
David A Spilo, Austin, TX (US);
Timothy J Baldwin, Austin, TX (US);
Robert D Bryfogle, Austin, TX (US);
Bobby I Pinkerton, Jr, Austin, TX (US);
Assignee:
Advanced Micro Devices, Sunnyvale, CA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06F / ;
U.S. Cl.
CPC ...
371 213 ;
Abstract
A processing unit having a CPU core, an integrated RAM and a test unit, which may be implemented in either a test unit, which may be implemented in either hardware or software. A built-in self-test of the RAM is designed to run concurrently with the functional vectors used to test the CPU core. Once the core tests have been activated, a control register may be written to by which will activate the built-in self-test. Thus, the BIST and core testing may overlap to minimize test time.