The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Apr. 24, 1996
Myung-chan Choi, Kyungki-do, KR;
Churoo Park, Kyungki-do, KR;
Samsung Electronics Co., Ltd., Suwon, KR;
Abstract
A method for testing a plurality of data bits includes the steps of accepting the plurality of data bits at the test circuit, and comparing first and second data bits from the plurality of data bits to determine if the first and second data bits have a common data value. A first comparison signal is generated responsive to the comparison of the first and second data bits. The first comparison signal has a first logic state when the first and second data bits have a common data value and a second logic state when the first and second data bits have different data values. Third and fourth data bits from the plurality of data bits are compared to determine if the third and fourth data bits have a common data value. A second comparison signal is generated responsive to the comparison of the third and fourth data bits wherein the second comparison signal has the first logic state when the third and fourth data bits have a common data value and the second logic state when the third and fourth data bits have different data values.