The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Oct. 10, 1995
Wolfgang Konder, Trier, DE;
Heinz-Peter Wollscheid, Gusterath, DE;
Laeis + Bucher GmbH, Trier, DE;
Abstract
A method and an apparatus for conducting quality inspection of molded/formed articles (2) produced in a molding or forming machine which enables automation of the inspection by sensing surface coordinates using an optical triangulation sensor moved along a suitable sensing path (5), wherein spatial coordinate values of the surface of the article (2) obtained in the course of the movement of the sensor along the sensing path (5) are used to generate actual dimensional parameters which are compared with dimensional parameters determined for the prescribed desired dimensional form of the article, and the quality of the article (2) is evaluated based on the results of the comparisons.