The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Oct. 27, 1995
Harold J Orlando, Costa Mesa, CA (US);
Michael L Pappas, Anaheim, CA (US);
Marco A Lopez, Villa Park, CA (US);
Northrop Grumman Corporation, Los Angeles, CA (US);
Abstract
A system for automatically performing the Minimum Resolvable Contrast (MRC) test on an image sensor, such as a TV camera, using a digital signal processor for controlling the testing, wherein an edge response from a square aperture target edge is used to generate a Modulation Transfer Function (MTF) which, in combination with signal and noise data obtained using the square aperture target, provides an input to automated MRC (AMRC) processing equations, from which a value can be calculated for an AMRC output. Alternatively, a slit target may be substituted for the square target aperture when measuring camera MTF.