The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.

The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.

Date of Patent:
May. 05, 1998

Filed:

Aug. 11, 1995
Applicant:
Inventors:

Noboru Higashi, Yokohama, JP;

Koichi Sano, Yokohama, JP;

Assignee:

Hitachi, Ltd., Tokyo, JP;

Attorney:
Primary Examiner:
Int. Cl.
CPC ...
G06T / ;
U.S. Cl.
CPC ...
345427 ;
Abstract

Three-dimensional image data of an object is generated by an x-ray CT or magnetic resonance imaging system, and used to produce a flat pattern of the whole surface image of the object. An imaginary slit is provided in a three-dimensional space of the three-dimensional image data, and the image seen through this slit is generated by volume rendering. The above operation is repeated as this imaginary slit is moved along the periphery of the object of the three-dimensional image data. The generated image data are arranged laterally to produce a flat pattern. All the three-dimensional image data are not processed by volume rendering, but only the portion limited to a depth is processed to prevent the structure information of the rear side of the object from being mixed in the flat pattern.


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