The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Oct. 04, 1996
John Jungwoo Kim, Riverside, CA (US);
McDonnell Douglas Corporation, Huntington Beach, CA (US);
Abstract
The thickness of a semi transparent layer, such as ice, is determined by supporting the layer atop or above a light transmissive window and directing multiple light beams through the light transmissive window and into the layer. The light transmissive window has a higher index of refraction than the layer or any intermediate layer directly above the semi-transparent layer. Light beams are directed at an angle to the surface that results in total internal reflection from the outer surface of the supported semi-transparent layer. The light reflected to the rear of the window at the same but opposite angle is monitored and correlates to the thickness of the monitored layer. The spatial distribution of reflected light along the longitudinal axis of the window changes in dependence upon the thickness of the supported layer. Quantitative indications of that thickness are displayed and should that thickness exceed a prescribed level an alarm may be generated. The monitoring system has application as a non-intrusive ice detection system for aircraft airfoil surfaces.