The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
May. 14, 1996
Reza Zoughi, Ft. Collins, CO (US);
Chin-Yung Yeh, Taipei, TW;
Stoyan I Ganchev, Ft. Collins, CO (US);
Christian Huber, Ft. Collins, CO (US);
Colorado State University Research Foundation, Fort Collins, CO (US);
Abstract
A method and apparatus for determining fatigue/surface crack features on metal surfaces is disclosed wherein the cracks may be empty, filled, or covered with a dielectric (e.g., paint). The present invention includes a microwave waveguide having an aperture for scanning over a surface and thereby characterizing changes in a standing wave within the waveguide when a crack is scanned. In particular, crack related data resulting from standing wave perturbations can be analyzed for determining crack geometric features such as crack width, crack depth, crack length and crack tips. These features are determinable with high precision in comparison to the size of the aperture. When locating and/or sizing the geometric features of a crack, voltage changes induced by higher order modes generated by various orientations of the crack in relation to the aperture are utilized for generating the crack related data. Further, estimates are provided as to the accuracy of a location and/or size estimate for the crack geometric features. The present invention is particularly useful for repair of steel bridges, plains, turbines and other metallic structures subject to surface fatigue cracks.
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile