The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Nov. 13, 1996
Applicant:
Inventors:
Masayoshi Yano, Hitachinaka, JP;
Kohei Mochizuki, Hitachinaka, JP;
Assignee:
Hitachi, Ltd., Tokyo, JP;
Attorney:
Primary Examiner:
Int. Cl.
CPC ...
H01J / ;
U.S. Cl.
CPC ...
250292 ; 250281 ;
Abstract
A three-dimensional quadrupole mass spectrometer is suitable for preventing occurrence of a situation where the mass spectrometry cannot be conducted by an excessive existence of ions in a three-dimensional ion confining space, an amount of ions emitted from an ion source 1 is detected by a first electrode 3 of a lens, an output signal therefrom is inputted to a power supply 17 of a second electrode 4 of the lens and a focusing condition of ions caused by the lens is changed such that an amount of ions existing in the three-dimensional ion confining space does not exceed a certain level.