The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
May. 05, 1998
Filed:
Mar. 25, 1996
Okuma Corporation, Aichi-ken, JP;
Abstract
The present invention achieves machining operation without grind-burning and grinding crack and improves the profile accuracy of a workpiece, by automatically generating X/C axis data that controls the headstock and the wheel spindle head while taking into account speed, acceleration, change in acceleration and contact arc length. Storage means 33 for storing the time taken by the workpiece to make one turn, reference X/C axis data computing element 53 for computing machining data from given angle and a set of lift points to control the grinding peripheral speed constant within a range where the machine can follow, computing element 56 for computing contact arc during grinding from the X/C axis data, storage means 53 for storing limitation value of X axis based on the contact arc while changing it according to C axis, computing means 46 for storing said reference X/C axis data and computing speed, acceleration and change in acceleration while reading the reference X/C axis data by skipping a specified number of steps, and modifying element 57 for reducing said number of steps to bring the speed, acceleration and change in acceleration within limits when any of these values exceeds the limit are provided, thereby to carry out synchronous control of the work spindle rotation and reciprocal motion of the wheel spindle head according to the modified X/C axis data.