The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Apr. 29, 1994
Larry T Jost, St. Louis, MO (US);
SBC Technology Resources, Inc., Austin, TX (US);
Abstract
Tuning mechanisms are provided for tuning tunable parameters of a memory subsystem's cache. A simplified tuning mechanism switches drain mechanisms on and off depending upon the amount of updated buffers present within the cache at a particular time. The drain mechanisms may include a drain-on-read module and a drain-on-write module. In addition, a tuning mechanism automatically and continuously tunes tunable parameters of a storage control processor, by measuring durations of I/O processing events being performed by the storage control processor, and gathering sample values which form sample sets based upon the durations measured. After a first sample set is obtained, a tunable parameter is changed by incrementing or decrementing the parameter by a pre-defined delta value. A second sample set is then obtained after the parameter was changed. Once the second sample set is obtained, the I/O events that were measured to obtain the first sample set are compared to the I/O events that were measured to obtain the second set in order to determine if the mixtures of I/O events are similar. If the mixtures of I/O events of the first sample set are similar to those of the second set, a determination is made as to whether there was an overall decrease in the lengths of durations of I/O processing events measured after the parameter was changed. The parameter change is maintained if it is determined that there was an overall decrease in the lengths of I/O processing event durations measured after the parameter was changed.