The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Jan. 29, 1997
Applicant:
Inventors:
Neil R Nelson, Anaheim, CA (US);
Harold J Orlando, Costa Mesa, CA (US);
Marco A Lopez, Villa Park, CA (US);
Assignee:
Northrop Grumman Corporation, Los Angeles, CA (US);
Attorneys:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382264 ; 348618 ; 358468 ; 382275 ;
Abstract
This invention is an apparatus and method that is able to accurately measure the system level modulation transfer function in the presence of fixed pattern noise from an imaging system electronics.
Quick Actions:
Nelson, Neil. (1998). Fixed pattern compensation with adaptive window for mtf testing (U.S. Patent No. 5745609). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5745609
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