The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Jul. 31, 1995
Applicant:
Inventors:
Shih-Jong J Lee, Bellevue, WA (US);
Michael G Meyer, Seattle, WA (US);
Chih-Chau L Kuan, Redmond, WA (US);
Paul S Wilhelm, Kirkland, WA (US);
Assignee:
NeoPath, Inc., Redmond, WA (US);
Attorneys:
Primary Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382225 ; 382228 ;
Abstract
A classifier measures robustness responsive to object presentation effects and decision boundary effects. A cytological image analysis computer obtains objects of interest and classifies them responsive to a decision tree classifier. The robustness of classification is calculated dynamically as objects are classified responsive to a segmentation robustness and a classification decisiveness measure. The results of the decisiveness measure and the segmentation robustness data are combined to provide enhanced overall classification reliability.