The patent badge is an abbreviated version of the USPTO patent document. The patent badge does contain a link to the full patent document.
The patent badge is an abbreviated version of the USPTO patent document. The patent badge covers the following: Patent number, Date patent was issued, Date patent was filed, Title of the patent, Applicant, Inventor, Assignee, Attorney firm, Primary examiner, Assistant examiner, CPCs, and Abstract. The patent badge does contain a link to the full patent document (in Adobe Acrobat format, aka pdf). To download or print any patent click here.
Patent No.:
Date of Patent:
Apr. 28, 1998
Filed:
Jul. 27, 1995
Applicant:
Inventor:
Vishvjit Singh Nalwa, Middletown, NJ (US);
Assignee:
Lucent Technologies Inc., Murray Hill, NJ (US);
Attorney:
Primary Examiner:
Assistant Examiner:
Int. Cl.
CPC ...
G06K / ;
U.S. Cl.
CPC ...
382119 ; 382187 ;
Abstract
Forgeries are detected by curve fitting the signature in question. The length of the curve fitted signature and the length of the signature in question are compared. If the signature in question is a traced or copied forgery, it will tend to have a significant amount of jitter which results in a significantly longer length than the curved fitted signature.
Nalwa, Vishvjit. (1998). Method for detecting forgery in a traced signature by measuring an (U.S. Patent No. 5745592). U.S. Patent and Trademark Office. https://idiyas.com/patent/badge/5745592
Data source: USPTO (United States Patent and Trademark Office) public patent records. Weekly synchronization. How IDiyas builds this profile